✦ LIBER ✦
Degradation of current drivability of Schottky barrier source/drain transistors induced by high-k gate dielectrics and possible measures to suppress the phenomenon
✍ Scribed by Mizuki Ono; Akira Nishiyama; Masato Koyama
- Book ID
- 108269546
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 270 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0038-1101
No coin nor oath required. For personal study only.