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Degradation Mode Analysis on Highly Reliable Guardring-Free Planar InAlAs Avalanche Photodiodes

✍ Scribed by Ishimura, E.; Yagyu, E.; Nakaji, M.; Ihara, S.; Yoshiara, K.; Aoyagi, T.; Tokuda, Y.; Ishikawa, T.


Book ID
115372476
Publisher
Optical Society of America
Year
2007
Tongue
English
Weight
671 KB
Volume
25
Category
Article
ISSN
0733-8724

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