Degradation mechanisms in rewritable n-channel FAMOS devices : R. C. Dockerty. 13th Ann. Proc. Reliability Physics Symp. Nevada. p. 6, 1975

• Book ID: 103269534
• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 127 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90059-1