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Degradation Due to Bending Fatigue Strain in YBCO Coated Conductors

✍ Scribed by Takao, T.; Sakabe, R.; Asano, T.; Mitsui, S.; Nakao, K.; Shiohara, Y.; Kashima, N.

Book ID: 118263252
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 433 KB
Volume: 19
Category: Article
ISSN: 1051-8223
DOI: 10.1109/tasc.2009.2018246

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