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Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing

โœ Scribed by J. Liu; H. Wong; S.L. Siu; C.W. Kok; V. Filip


Book ID
119326620
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
569 KB
Volume
52
Category
Article
ISSN
0026-2714

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