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Degradation behavior of avalanche photodiodes with a mesa structure observed using a digital OBIC monitor
✍ Scribed by Takeshita, T.; Hirota, Y.; Ishibashi, T.; Muramoto, Y.; Ito, T.; Tohmori, Y.; Ito, H.
- Book ID
- 114618308
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 604 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0018-9383
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