Deformation stacking fault probability and dislocation microstructure of cold worked Cu–Sn–5Zn alloys by x-ray diffraction line profile analysis

✍ Scribed by Dey, S. N.; Chatterjee, P.; Sen Gupta, S. P.

• Book ID: 120088861
• Publisher: American Institute of Physics
• Year: 2006
• Tongue: English
• Weight: 357 KB
• Volume: 100
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.2356906