The deformation mechanisms of GaN thin films obtained by metal-organic chemical vapor deposition (MOCVD) method were studied using nanoindentation with a Berkovich diamond indenter, micro-Raman spectroscopy and the cross-sectional transmission electron microscopy (XTEM) techniques. Due to the sharpn
✦ LIBER ✦
Deformation-Mechanism Map for CuNi Thin Films
✍ Scribed by Brückner, W.
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 148 KB
- Volume
- 176
- Category
- Article
- ISSN
- 0031-8965
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