Defects in Organic Semiconductors and Devices

✍ Scribed by Thien-Phap Nguyen

• Publisher: Wiley
• Year: 2023
• Tongue: English
• Leaves: 279
• Series: Electronics Engineering Series
• Category: Library

✦ Table of Contents

Cover
Title Page
Copyright Page
Contents
Abbreviations
Introduction
Chapter 1. Overview of Organic Semiconductors
1.1. Organic semiconductors
1.2. Doping of organic semiconductors
1.3. Organic electronic devices
1.3.1. Architectures of organic devices
1.3.2. Organic light-emitting diodes (OLEDs)
1.3.3. Organic solar cells (OSCs or OPVs)
1.3.4. Organic field-effect transistors (OFETs)
Chapter 2. Defects in Materials
2.1. Order and disorder
2.2. Crystalline semiconductors
2.2.1. Localized states
2.2.2. Density of states (DOS)
2.3. Amorphous semiconductors
2.3.1. Localized states
2.3.2. Density of states (DOS)
2.4. Organic semiconductors
2.4.1. Polymer structure
2.4.2. Polymer crystallinity
2.4.3. Defects in conjugated polymers
2.4.4. Defects in small-molecule crystals
2.4.5. Localized states
2.4.6. Density of states
2.5. Distribution of the energetic states
Chapter 3. Defects and Physical Properties of Semiconductors
3.1. Carrier transport in organic semiconductors
3.1.1. Hopping conduction
3.1.2. Uniform density of states model
3.1.3. Non-uniform density of states models
3.2. Effects of defects on the carrier transport
3.2.1. Traps and recombination centers
3.2.2. Trapping mechanisms and trap parameters
3.3. Optical properties of semiconductors and defects
3.3.1. Defects and absorption
3.3.2. Defects and luminescence
Chapter 4. Techniques for Studying Defects in Semiconductors
4.1. Electron spin resonance (ESR)
4.1.1. Basic concepts of ESR
4.1.2. Interpretation of ESR line
4.1.3. Electron nuclear double resonance (ENDOR)
4.1.4. Investigation of defects using the ESR technique
4.2. Optical techniques
4.2.1. Fluorescence spectroscopy (FL)
4.2.2. Thermally stimulated luminescence (TSL) spectroscopy
4.3. Electrical techniques
4.3.1. Thermally stimulated current (TSC) technique
4.3.2. Current–voltage measurements: space charge-limited current (SCLC)
4.3.3. Impedance spectroscopy (IS)
4.3.4. Deep-level transient spectroscopy (DLTS)
4.3.5. Time of flight (TOF) and charge carrier extraction by linearly increasing voltage (CELIV) techniques
Chapter 5. Defect Origins
5.1. Defects in organic semiconductors
5.1.1. Structural defects
5.1.2. Impurity defects
5.2. Defects in organic devices
5.2.1. Defects from the semiconductor
5.2.2. Defects from the surface and the interface
5.2.3. Defects from diffused impurities
Chapter 6. Defects, Performance and Reliability of Organic Devices
6.1. Impact of defects on the performance of organic devices
6.1.1. Defects and efficiency of OLEDs
6.1.2. Defects and efficiency of OPVs
6.1.3. Defects and performance of OFETs
6.2. Impact of defects on the stability of organic devices
6.2.1. Overview of degradation mechanisms in organic semiconductors and devices
6.2.2. Defects and degradation of organic semiconductor and devices
Future Prospects
References
Index
EULA