Defects in nitride semiconductors: From nanoscale imaging to macroscopic device behavior

✍ Scribed by B.S. Simpkins; H. Zhang; E.T. Yu

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 467 KB
• Volume: 9
• Category: Article
• ISSN: 1369-8001
• DOI: 10.1016/j.mssp.2006.01.025