<P><STRONG>Uncover the Defects that Compromise Performance and Reliability As microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication pr
Defects in microelectronic materials and devices
β Scribed by D M Fleetwood; Sokrates T Pantelides; Ronald Donald Schrimpf
- Publisher
- CRC Press
- Year
- 2009
- Tongue
- English
- Leaves
- 753
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Subjects
ΠΡΠΈΠ±ΠΎΡΠΎΡΡΡΠΎΠ΅Π½ΠΈΠ΅;ΠΠΎΠ»ΡΠΏΡΠΎΠ²ΠΎΠ΄Π½ΠΈΠΊΠΎΠ²ΡΠ΅ ΠΏΡΠΈΠ±ΠΎΡΡ;
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<p>Understanding the formation and introduction mechanisms of defects in semiconductors is essential to understanding their properties. Although many defect-related problems have been identified and solved over the past 60 years of semiconductor research, the quest for faster, cheaper, lower power,
<p>The papers collected in this volume were presented at the International Symposium on Methods and Materials in Microelectronic Technology. This symposium was sponsored by IBM Germany, and it was held September 29 - October 1, 1982, in Bad Neuenahr, West Germany. The progress of semiconductor and m
Combining solid state devices with electronic circuits for the junior level microelectronics course, this new textbook offers an integrated approach so that students truly understand how a circuit works. Other features include an emphasis on modeling of electronic devices and analysis of non-linear