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Defects in dilute nitrides: significance and experimental signatures

✍ Scribed by Chen, W.M.; Buyanova, I.A.; Tu, C.W.

Book ID: 114456124
Publisher: The Institution of Electrical Engineers
Year: 2004
Tongue: English
Weight: 289 KB
Volume: 151
Category: Article
ISSN: 1350-2433
DOI: 10.1049/ip-opt:20040939

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