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Defects in 6LiInSe2 neutron detector investigated by photo-induced current transient spectroscopy and photoluminescence

✍ Scribed by Cui, Yunlong; Bhattacharya, Pijush; Buliga, Vladimir; Tupitsyn, Eugene; Rowe, Emmanuel; Wiggins, Brenden; Johnstone, Daniel; Stowe, Ashley; Burger, Arnold

Book ID
121653369
Publisher
American Institute of Physics
Year
2013
Tongue
English
Weight
632 KB
Volume
103
Category
Article
ISSN
0003-6951

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Contactless electrical defect characteri
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## Abstract The contactless electrical characterization techniques MDP and MD‐PICTS will be presented in this paper. Both methods are predestined for defect investigation in a variety of semiconductors. Due to a so far not reached sensitivity, major advantages of MDP are its high spatial resolution