Defects and electrical behavior in 1 MeV Si[sup +]-ion-irradiated 4H–SiC Schottky diodes

✍ Scribed by Roccaforte, F.; Libertino, S.; Raineri, V.; Ruggiero, A.; Massimino, V.; Calcagno, L.

• Book ID: 120350601
• Publisher: American Institute of Physics
• Year: 2006
• Tongue: English
• Weight: 367 KB
• Volume: 99
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.2158501