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Defect trapping of ion-implanted deuterium in nickel

✍ Scribed by Besenbacher, F.


Book ID
121496514
Publisher
American Institute of Physics
Year
1982
Tongue
English
Weight
1013 KB
Volume
53
Category
Article
ISSN
0021-8979

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High purity beryllium samples were loaded with deuterium by ion-implantation at 25Β°C or by thermal absorption in D e gas at 300-500Β°C. The samples were then thermally ramped up to 800Β°C at rates of 2-3Β°C/min, and the released deuterium measured as a function of temperature using a mass spectrometer.