Defect study in ZnO related structures—A multi-spectroscopic approach

✍ Scribed by C.C. Ling; C.K. Cheung; Q.L. Gu; X.M. Dai; S.J. Xu; C.Y. Zhu; J.M. Luo; C.Y. Zhu; K.H. Tam; A.B. Djurišić; C.D. Beling; S. Fung; L.W. Lu; G. Brauer; W. Anwand; W. Skorupa; H.C. Ong

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 526 KB
• Volume: 255
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2008.05.309