𝔖 Bobbio Scriptorium
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Defect size variations and their effect on the critical area of VLSI devices

✍ Scribed by Ferris-Prabhu, A.V.


Book ID
119798488
Publisher
IEEE
Year
1985
Tongue
English
Weight
433 KB
Volume
20
Category
Article
ISSN
0018-9200

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