Defect scaling in non-crystalline floppy/under-constrained and rigid/over-constrained thin films: Applications to a-Se, a-Si, and a-Si(H)

✍ Scribed by Gerald Lucovsky; Safa O. Kasap; James C. Phillips

• Book ID: 116670897
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 142 KB
• Volume: 354
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/j.jnoncrysol.2007.09.048