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Defect-related lattice strain and the transition temperature in ferroelectric thin films

✍ Scribed by Balzar, D.; Ramakrishnan, P. A.; Hermann, A. M.

Book ID: 126312598
Publisher: The American Physical Society
Year: 2004
Tongue: English
Weight: 41 KB
Volume: 70
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.70.092103

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