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Defect-modified exchange bias

✍ Scribed by Kim, Joo-Von; Stamps, R. L.

Book ID: 111912254
Publisher: American Institute of Physics
Year: 2001
Tongue: English
Weight: 414 KB
Volume: 79
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1413731

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