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Defect microstructure in copper after low fluence irradiation with 440 MeV argon and 230 MeV neon ions

✍ Scribed by F. Paschoud; M. Victoria; G. Szenes; K. Havancsak


Book ID
107810869
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
283 KB
Volume
212-215
Category
Article
ISSN
0022-3115

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