Defect localization by orthogonally projected multiple signal classification approach for magnetic flux leakage fields

✍ Scribed by R. Baskaran; M.P. Janawadkar

• Book ID: 104064935
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 228 KB
• Volume: 41
• Category: Article
• ISSN: 0963-8695
• DOI: 10.1016/j.ndteint.2008.03.009