Defect investigation and temperature analysis of high-power AlGaInP laser diodes during catastrophic optical damage

✍ Scribed by Marwan Bou Sanayeh; Peter Brick; Wolfgang Schmid; Bernd Mayer; Martin Müller; Martin Reufer; Klaus Streubel; Sandy Schwirzke-Schaaf; Jens W. Tomm; Andreas Danilewsky; Gerd Bacher

• Book ID: 106397948
• Publisher: Springer US
• Year: 2007
• Tongue: English
• Weight: 361 KB
• Volume: 19
• Category: Article
• ISSN: 0957-4522
• DOI: 10.1007/s10854-007-9478-z