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Defect influence on luminescence efficiency of GaN-based LEDs

✍ Scribed by Shuping Li; Zhilai Fang; Hangyang Chen; Jinchai Li; Xiaohong Chen; Xiaoli Yuan; Takashi Sekiguchi; Qiming Wang; Junyong Kang


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
143 KB
Volume
9
Category
Article
ISSN
1369-8001

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✦ Synopsis


Wafers with normal light-emitting diode structure were grown by metal organic chemical vapor deposition system. The pressure and temperature were varied during growth of buffer layer in order to grow different types of epilayers. The cathodoluminescence results show that the interface distortion of quantum well plays an important role in radiant efficiency. The electroluminescence detections indicate that the dislocations also influence the external quantum efficiency by lowering the electron injection efficiency.


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