Defect generation in non-nitrided and nitrided sputtered gate oxides under post-irradiation Fowler–Nordheim constant current stress

✍ Scribed by Jelenković, Emil V.; Kovačević, Milojko; Jha, S.; Tong, K.Y.; Nikezić, D.

• Book ID: 123408055
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 425 KB
• Volume: 104
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2012.10.016