Defect evolution and accompanied change of electrical properties during the GaN growth by metalorganic chemical vapor deposition

✍ Scribed by D.G. Zhao; D.S. Jiang; J.J. Zhu; X. Guo; Z.S. Liu; S.M. Zhang; Y.T. Wang; Hui Yang

• Book ID: 116605454
• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 304 KB
• Volume: 487
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/j.jallcom.2009.07.147