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Defect engineering for 650 nm high-power AlGaInP laser diodes

โœ Scribed by D.S. Kim; K.C. Kim; Y.C. Shin; D.H. Kang; B.J. Kim; Y.M. Kim; Y. Park; T.G. Kim


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
128 KB
Volume
376-377
Category
Article
ISSN
0921-4526

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