Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT

✍ Scribed by C. Sydlo; B. Mottet; H. Ganis; H.L. Hartnagel; V. Krozer; S.L. Delage; S. Cassette; E. Chartier; D. Floriot; S. Bland

• Book ID: 118539792
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 335 KB
• Volume: 41
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(01)00184-6