Defect creation caused by the decay of cation excitons and hot electron–hole recombination in wide-gap dielectrics

✍ Scribed by A. Lushchik; Ch. Lushchik; M. Kirm; V. Nagirnyi; F. Savikhin; E. Vasil’chenko

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 436 KB
• Volume: 250
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2006.04.133