✦ LIBER ✦
Defect control in semiconductors. Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, The Yokohama 21st Century Forum, Yokohama, Japan, September 17–22, 1989. North-Holland, Amsterdam, New York, Oxford, Tokyo, 1990 Volume I 972 pages, Volume II 760 pages, Proce: US $ 436.00/Dfl. 850.00, ISBN 0444884297
✍ Scribed by G. Wagner; K. Sumino
- Publisher
- John Wiley and Sons
- Year
- 1991
- Tongue
- English
- Weight
- 94 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0232-1300
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