✦ LIBER ✦
Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks
✍ Scribed by Rosado, Luis S.; Janeiro, Fernando M.; Ramos, Pedro M.; Piedade, Moises
- Book ID
- 120221280
- Publisher
- IEEE
- Year
- 2013
- Tongue
- English
- Weight
- 988 KB
- Volume
- 62
- Category
- Article
- ISSN
- 0018-9456
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