Defect Characteristics in Different Crystallographic Directions in CzSi as a Function of Doping and Annealing

✍ Scribed by Puff, W. ;Dannefaer, S. ;Mascher, P. ;Kerr, D.

• Publisher: John Wiley and Sons
• Year: 1987
• Tongue: English
• Weight: 327 KB
• Volume: 102
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211020207