Defect centers in silicon produced by room temperature electron irradiation. II. Thermally stimulated conductivity studies

✍ Scribed by Natarajan, K. ;Heasell, E. L.

• Publisher: John Wiley and Sons
• Year: 1975
• Tongue: English
• Weight: 326 KB
• Volume: 29
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210290122