✦ LIBER ✦
Defect Behaviors During High Electric Field Stress of p-Channel Power MOSFETs
✍ Scribed by Ristic, Goran S.
- Book ID
- 121232236
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 428 KB
- Volume
- 12
- Category
- Article
- ISSN
- 1530-4388
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