✦ LIBER ✦
Defect analysis system speeds test and repair of redundant memories : M. Tarr, D. Boudreau and R. Murphy. Electronics 175 (12 January 1984)
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 132 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
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