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Defect analysis of hydrogenated nanocrystalline Si thin films

โœ Scribed by A. Cavallini; D. Cavalcoli; M. Rossi; A. Tomasi; S. Pizzini; D. Chrastina; G. Isella


Book ID
103885346
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
643 KB
Volume
401-402
Category
Article
ISSN
0921-4526

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