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Defect analysis of bipolar CdTe using Photo-Hall and photoconductivity measurements in the temperature range 115 to 293 K

✍ Scribed by Jandl, P. ;Rick, M. ;Rosenzweig, J.


Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
393 KB
Volume
121
Category
Article
ISSN
0031-8965

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