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Defect analysis in FeAl and FeSi with positron lifetime spectroscopy and Doppler broadening

✍ Scribed by A. Broska; J. Wolff; M. Franz; Th. Hehenkamp


Book ID
117681857
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
258 KB
Volume
7
Category
Article
ISSN
0966-9795

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