✦ LIBER ✦
Deep states associated with oxidation induced stacking faults in RTA p-type silicon before and after copper diffusion
✍ Scribed by M Saritas; A.R Peaker
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 880 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0038-1101
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