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Deep Levels in Si(p) Implanted with C+, N+, O+, and Ne+ Ions Measured by DLTS Method

✍ Scribed by Kotliński, J. ;Mojejko-Kotlińska, K. ;Subotowicz, M. ;Beylowska, I.


Book ID
105379030
Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
235 KB
Volume
94
Category
Article
ISSN
0031-8965

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