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Deep-level defects and diffusion length measurements in low energy proton-irradiated GaAs

✍ Scribed by Sheng S. Li; W. L. Wang; P. W. Lai; R. T. Owen; R. Y. Loo; S. G. Kamath

Book ID: 112822181
Publisher: Springer US
Year: 1980
Tongue: English
Weight: 671 KB
Volume: 9
Category: Article
ISSN: 0361-5235
DOI: 10.1007/bf02670853

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