Deep-depletion high-frequency capacitance-voltage responses under photonic excitation and distribution of interface states in MOS capacitors

✍ Scribed by Kim, D.M.; Song, S.J.; Kim, H.T.; Kang, D.W.; Song, S.H.; Min, K.S.

• Book ID: 114617046
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 349 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2003.812096