✦ LIBER ✦
Deep defect determination by the constant photocurrent method (CPM) in annealed or light soaked amorphous hydrogenated silicon (a-Si:H)
✍ Scribed by Andreas Mettler; Nicolas Wyrsch; Michael Goetz; Arvind Shah
- Book ID
- 108029193
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 359 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0927-0248
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