Deep cryogenic noise and electrical characterization of the complementary heterojunction field-effect transistor (CHFET)

✍ Scribed by Cunningham, T.J.; Gee, R.C.; Fossum, E.R.; Baier, S.M.

• Book ID: 114535727
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 729 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.293298