Decoupling the Bias-Stress-Induced Charge Trapping in Semiconductors and Gate-Dielectrics of Organic Transistors Using a Double Stretched-Exponential Formula

✍ Scribed by Hyun Ho Choi; Moon Sung Kang; Min Kim; Haena Kim; Jeong Ho Cho; Kilwon Cho

• Book ID: 115548633
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 614 KB
• Volume: 23
• Category: Article
• ISSN: 1616-301X
• DOI: 10.1002/adfm.201201545