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DC modulation noise in thin metallic media and its application for head efficiency measurements

✍ Scribed by Bertram, H.; Hallamasek, K.; Madrid, M.

Book ID: 114648218
Publisher: IEEE
Year: 1986
Tongue: English
Weight: 560 KB
Volume: 22
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.1986.1064314

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