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Data-driven testing methodology for RFID systems

✍ Scribed by Lu, An ;Fang, Wenbin ;Xu, Chang ;Cheung, Shing-Chi ;Liu, Yu

Publisher: Higher Education Press and Springer
Year: 2010
Tongue: English
Weight: 342 KB
Volume: 4
Category: Article
ISSN: 1673-7350
DOI: 10.1007/s11704-010-0387-6

No coin nor oath required. For personal study only.

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