𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Data capture and playback test equipment

Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
95 KB
Volume
10
Category
Article
ISSN
0140-3664

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Any time a structure experiences stress reversal, part of its life is used up. The two most common types of stress cycles that cause the most damage in electronic equipment are thermal/temperature cycling and vibration cycling. These two types of cycling can occur separately or they can be combined.