Dark current reduction in stacked-type CMOS-APS for charged particle imaging

✍ Scribed by Takayanagi, I.; Nakamura, J.; Fossum, E.R.; Nagashima, K.; Kunihoro, T.; Yurimoto, H.

• Book ID: 114616939
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 531 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2002.806963