Dangling-bond defect in a-Si:H: Characterization of network and strain effects by first-principles calculation of the EPR parameters

✍ Scribed by Pfanner, G.; Freysoldt, C.; Neugebauer, J.; Inam, F.; Drabold, D.; Jarolimek, K.; Zeman, M.

• Book ID: 125974383
• Publisher: The American Physical Society
• Year: 2013
• Tongue: English
• Weight: 647 KB
• Volume: 87
• Category: Article
• ISSN: 1098-0121
• DOI: 10.1103/PhysRevB.87.125308